Circumferential and inner diameter metrology for the Advanced X-ray Astrophysical Facility (AXAF) optics
Abstract
The circularity and inner diameter station (CIDS) intended for acquiring data on the inside surfaces of the AXAF optics throughout the entire fabrication process is described. The CIDS is capable of measuring inner diameters of over 40 inches to within 70 microinches. It acquires circularity data which are accurate to better than 1 microinch rms after averaging and the removal of systematic errors.
- Publication:
-
Advanced optical manufacturing and testing
- Pub Date:
- November 1990
- DOI:
- 10.1117/12.22808
- Bibcode:
- 1990SPIE.1333..239G
- Keywords:
-
- Diameters;
- Grazing Incidence;
- Metrology;
- Optical Equipment;
- X Ray Astrophysics Facility;
- Circumferences;
- Technological Forecasting;
- X Ray Spectra;
- Instrumentation and Photography