Sensitive measurement of optical nonlinearities using a single beam Sheik-Bahae, M. ; Said, A. A. ; Wei, T. -H. ; Hagan, D. J. ; van Stryland, E. W. Abstract Publication: IEEE Journal of Quantum Electronics Pub Date: April 1990 DOI: 10.1109/3.53394 Bibcode: 1990IJQE...26..760S