The photoresponse nonuniformity of CCD image sensors can be characterized by rms variance. The dependence of photoresponse nonuniformity on transfer efficiency is analyzed theoretically, leading to a new approach to determine photoresponse nonuniformity and transfer efficiency accurately. A measurement system is set up, and the measurement results coincide with the theoretical analysis.
Chinese Journal of Infrared Research
- Pub Date:
- Charge Coupled Devices;
- Image Processing;
- Block Diagrams;
- Spectral Sensitivity;
- Instrumentation and Photography