Reflection technique for thermal mapping of semiconductors
Abstract
Semiconductors may be optically tested for their temperatures by illuminating them with tunable monochromatic electromagnetic radiation and observing the light reflected off of them. A transition point will occur when the wavelength of the light corresponds with the actual band gap energy of the semiconductor. At the transition point, the image of the semiconductor will appreciably darken as the light is transmitted through it, rather than being reflected off of it. The wavelength of the light at the transition point corresponds to the actual band gap energy and the actual temperature of the semiconductor.
- Publication:
-
Air Force Interim Report
- Pub Date:
- June 1989
- Bibcode:
- 1989aifo.reptQ....W
- Keywords:
-
- Images;
- Reflection;
- Semiconductors (Materials);
- Thermal Mapping;
- Thermodynamic Properties;
- Electromagnetic Radiation;
- Light (Visible Radiation);
- Monochromatic Radiation;
- Patents;
- Solid-State Physics