Apparatus for measuring the specular reflectance of optical components at cryogenic temperatures
Abstract
A unique apparatus for measuring the specular reflectance of bare and anti-reflection coated optical components, at cryogenic temperatures, has been developed through a joint effort between the Metrology Department and the Electro-Optical Center of Rockwell International Corporation's Autonetics Electronics Systems Division, in Anaheim, California. An invention disclosure for the apparatus has been filed with Rockwell.
- Publication:
-
Imaging infrared: Scene simulation, modeling, and real image tracking
- Pub Date:
- September 1989
- DOI:
- 10.1117/12.960738
- Bibcode:
- 1989SPIE.1110...82G
- Keywords:
-
- Antireflection Coatings;
- Cryogenic Temperature;
- Optical Measuring Instruments;
- Specular Reflection;
- Calibrating;
- Cryogenic Equipment;
- Spectrophotometers;
- Windows (Apertures);
- Engineering (General)