Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions
Abstract
We have measured negative secondary-ion yields from phenylalanine, CsI, and Au bombarded by complex ions of 5-28 keV. The primary ions were organic monomer and dimer ions and clusters of CsI. Large enhancements occur in the measured secondary-ion yields for more complex projectiles. We show that secondary-ion yields of Au- atomic species are related to the square of the projectile momentum.
- Publication:
-
Physical Review Letters
- Pub Date:
- October 1989
- DOI:
- 10.1103/PhysRevLett.63.1625
- Bibcode:
- 1989PhRvL..63.1625B
- Keywords:
-
- 79.20.Nc;
- 79.20.Rf;
- 79.90.+b;
- Atomic molecular and ion beam impact and interactions with surfaces;
- Other topics in electron and ion emission by liquids and solids and impact phenomena