A reliability test system for educational purposes-basic data Billinton, R. ; Kumar, S. ; Chowdhury, N. ; Chu, K. ; Debnath, K. ; Goel, L. ; Khan, E. ; Kos, P. ; Nourbakhsh, G. ; Oteng-Adjei, J. Abstract Publication: IEEE Transactions on Power Systems Pub Date: August 1989 DOI: 10.1109/59.32623 Bibcode: 1989ITPSy...4.1238B