Dielectric constant of evaporated SiO at frequencies between 13 and 103 GHz
Abstract
An integrated Josephson tunnel junction and microstrip resonator have been used to determine the dielectric constant of evaporated SiO. The method is straightforward in that it uses conventional microwave techniques to calculate the impedances for different frequencies and parasitic effects are negligible. A frequencyindependent value of 5.5 +/ 0.4 was calculated for the 13 to 103GHz range. At each resonant frequency a step appeared at the corresponding voltage in the currentvoltage curve. For each resonant frequency, a dielectric constant was calculated. The constant does not change appreciably from the average value of 5.5 throughout the whole frequency range, in agreement with previous measurements.
 Publication:

IEEE Transactions on Magnetics
 Pub Date:
 March 1989
 DOI:
 10.1109/20.92485
 Bibcode:
 1989ITM....25.1115O
 Keywords:

 Dielectrics;
 Josephson Junctions;
 Microstrip Transmission Lines;
 Microwave Circuits;
 Resonators;
 Silicon Oxides;
 Electrical Impedance;
 Electron Tunneling;
 Lc Circuits;
 Thin Films;
 Electronics and Electrical Engineering