Strength of three-layered composite structures subjected to mechanical and climatic effects
Abstract
A technique for the measurement of device derivatives d exp N V/dI exp N of arbitrary order N is described. Measurement is accomplished by injecting a test current composed of the sum of N square waves into the test device, and then multiplying the corresponding voltage change by the product of those same square waves, followed by low-pass filtering. The algorithm is implemented in real time using a mixture of analog and digital circuitry, and its application to semiconductor laser control in high-speed optical communications is described.
- Publication:
-
IEEE Journal of Solid-State Circuits
- Pub Date:
- August 1989
- DOI:
- 10.1007/BF00616270
- Bibcode:
- 1989IJSSC..24..976S
- Keywords:
-
- Optical Communication;
- Real Time Operation;
- Semiconductor Lasers;
- Square Waves;
- Volt-Ampere Characteristics;
- Laser Outputs;
- Laser Stability;
- Low Pass Filters;
- Semiconductor Diodes;
- Electronics and Electrical Engineering