Strength of threelayered composite structures subjected to mechanical and climatic effects
Abstract
A technique for the measurement of device derivatives d exp N V/dI exp N of arbitrary order N is described. Measurement is accomplished by injecting a test current composed of the sum of N square waves into the test device, and then multiplying the corresponding voltage change by the product of those same square waves, followed by lowpass filtering. The algorithm is implemented in real time using a mixture of analog and digital circuitry, and its application to semiconductor laser control in highspeed optical communications is described.
 Publication:

IEEE Journal of SolidState Circuits
 Pub Date:
 August 1989
 DOI:
 10.1007/BF00616270
 Bibcode:
 1989IJSSC..24..976S
 Keywords:

 Optical Communication;
 Real Time Operation;
 Semiconductor Lasers;
 Square Waves;
 VoltAmpere Characteristics;
 Laser Outputs;
 Laser Stability;
 Low Pass Filters;
 Semiconductor Diodes;
 Electronics and Electrical Engineering