Scanning tunneling microscopy and atomic force microscopy of the liquid-solid interface Schneir, J. ; Marti, O. ; Remmers, G. ; Gläser, D. ; Sonnenfeld, R. ; Drake, B. ; Hansma, P. K. ; Elings, V. Abstract Publication: Journal of Vacuum Science Technology Pub Date: March 1988 Bibcode: 1988JVST....6..283S