A special tester has been designed and constructed to meet requirements for extended-voltage (above the 15-kilovolt limit) electrostatic discharge (ESD) testing and to collect extended-voltage ESD damage threshold information. In designing the tester, some unique problems had to be solved in order to maintain a practical size, conform to specifications, and achieve reliable operation. The solutions to these problems are discussed, sample data are presented, and electron micrographs of typical failure sites are shown.
IN: ISTFA 1987 - International Symposium for Testing and Failure Analysis: Microelectronics; Proceedings of the Symposium
- Pub Date:
- Electric Discharges;
- Electronic Equipment Tests;
- Bipolar Transistors;
- Integrated Circuits;
- Electronics and Electrical Engineering