The response of a power MOSFET (N-channel) and a dielectric isolated operational amplifier to the combined environmental effects of high temperature and total dose gamma radiation

The purpose of the series of tests described was to determine how commercially available electronic components would respond in the combined temperature/radiation environments they might see on a space nuclear powered platform. The electrical components tested were those that reasonably could be expected to be used for instrumentation and control circuits for a space nuclear power plant. In addition, the tests were designed to determine the design margins for the devices. Another purpose of the test program was to identify the failure mechanisms for the electronic components and to make this information available to component designers. A brief description of each test and the rationale for the approach used is given.