Electro-optic sampling of high-speed, InP-based integrated circuits
Abstract
Multigigahertz waveforms in an InGaAs/InP MISFET inverter circuit were samples noninvasively using pulses from a gain-switched InGaAsP laser. Propagation delays of 21 ps per MISFET stage were measured.
- Publication:
-
Optical Society of America, Topical Meeting on Picosecond Electronics and Optoelectronics
- Pub Date:
- October 1987
- Bibcode:
- 1987osa..meetR..12W
- Keywords:
-
- Electro-Optics;
- Integrated Circuits;
- Sampling;
- Chips (Electronics);
- Field Effect Transistors;
- Indium Phosphides;
- Wave Propagation;
- Electronics and Electrical Engineering