A non-contact picosecond prober for integrated circuit testing
Abstract
A noncontact substrate-independent integrated circuit prober, based on electro-optic sampling, for internal node characterization of picosecond electrical waveforms at the water level, is described.
- Publication:
-
Optical Society of America, Topical Meeting on Picosecond Electronics and Optoelectronics
- Pub Date:
- October 1987
- Bibcode:
- 1987osa..meetR...4V
- Keywords:
-
- Electro-Optics;
- Integrated Circuits;
- Measuring Instruments;
- Performance Tests;
- Picosecond Pulses;
- Gallium Arsenides;
- Optical Fibers;
- Polarization (Waves);
- Electronics and Electrical Engineering