IAC based microwave/millimeter-wave testing
Abstract
A discussion is presented of the problems of developing instruments on a card (IAC) for microwave and millimeter-wave test instrumentation. The use of frequency translation to extend the capabilities of existing low-frequency IAC-based instrumentation into the microwave/millimeter-wave region is described. The results of a test arrangement using frequency translation are presented, and a specific implementation suited to IAC-based testing is described. It uses a combination of gallium arsenide monolithic microwave integrated circuits and dielectrically stablizied oscillators (DSOs) assembled on a microstrip board to realize a 10-MHz-18-GHz frequency translator in a physical format suitable for an IAC assembly. A calibration feature is described enabling the frequency drift with temperature of the DSO to be determined.
- Publication:
-
AUTOTESTCON 1987; Proceedings of the International Automatic Testing Conference
- Pub Date:
- 1987
- Bibcode:
- 1987ieee.proc...35P
- Keywords:
-
- Automatic Test Equipment;
- Avionics;
- Microwave Circuits;
- Millimeter Waves;
- Nondestructive Tests;
- Computerized Simulation;
- Integrated Circuits;
- Microstrip Transmission Lines;
- Electronics and Electrical Engineering