A scanning tunneling microscope for studying structurally inhomogeneous surfaces
Abstract
A method for studying the microrelief of atomically smooth and structurally inhomogeneous conducting surfaces is presented which uses a highly stable scanning tunneling microscope with a resolution of 0.2 and 2-3 A in the directions normal and parallel to the scanning plane, respectively. The main components and the principle of operation of the microscope are described, and results are presented for a 700-A-thick gold film vapor deposited in superfine vacuum.
- Publication:
-
Pisma v Zhurnal Tekhnischeskoi Fiziki
- Pub Date:
- August 1987
- Bibcode:
- 1987PZhTF..13..937V
- Keywords:
-
- Metal Surfaces;
- Microscopes;
- Scanning Tunneling Microscopy;
- Surface Properties;
- High Resolution;
- Inhomogeneity;
- Metal Films;
- Scanners;
- Silver;
- Instrumentation and Photography