Ultraviolet and extreme ultraviolet response of charge-coupled-device detectors
Abstract
Results of a program to enhance the ultraviolet and extreme ultraviolet response of charge-coupled devices are presented. The ultimate goal of the program is to develop a large format device with both high and stable quantum efficiency from 100 to 3000 A that can be used as a windowless imaging detector in a space environment. Ultraviolet quantum efficiency measurements have been made for several ion-implanted and laser-annealed test CCDs. Quantum efficiencies as high as 22 percent at 2500 A, where the absorption depth in silicon is about 55 A, have been observed in one such test CCD. Quantum efficiency measurements of standard back-illuminated CCDs are also presented.
- Publication:
-
Optical Engineering
- Pub Date:
- September 1987
- DOI:
- 10.1117/12.7974165
- Bibcode:
- 1987OptEn..26..875S
- Keywords:
-
- Charge Coupled Devices;
- Extreme Ultraviolet Radiation;
- Frequency Response;
- Imaging Techniques;
- Quantum Efficiency;
- Ultraviolet Detectors;
- Calibrating;
- Electrical Properties;
- Ion Implantation;
- Light Curve;
- Photons;
- Instrumentation and Photography