Radiation-induced response of operational amplifiers in low level transient radiation environments
Abstract
Computer simulations have been performed on CMOS and bipolar operational amplifiers in an attempt to obtain a better understanding of low-level transient radiation response mechanisms. The simulation methodology has been confirmed using flash X-ray data for the amplifiers studied. Variations in circuit response to loading and feeding configuration have been explored. Several generalizations can be made which may provide a basis for a specification methodology.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1987
- DOI:
- Bibcode:
- 1987ITNS...34.1442P
- Keywords:
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- Operational Amplifiers;
- Radiation Effects;
- Transient Response;
- Cmos;
- Computerized Simulation;
- Error Signals;
- Radiation Dosage;
- Electronics and Electrical Engineering