Design optimization of JCMOS structures
Abstract
JCMOS structures are based on merging an MOS capacitance, a JFET, and a bipolar transistor in an area of a single MOS transistor. The structure performs the basic operations of temporary storage, writing, and sensing of the stored data. It is used in DRAM, serial dynamic memory, and dynamic logic applications. In addition to the advantages of small size and high speed of operation, the use of the JCMOS structure to implement dynamic logic gates overcomes the problem of charge redistribution associated with conventional and domino CMOS logic circuits. In this paper, the JCMOS structure implementation using a retrograde p-well CMOS process is presented. An analytical model relating terminal voltages and currents to device dimensions and doping levels is derived. Simulation results are presented for both reading and writing modes of operation. A test cell was successfully fabricated to verify the principle of operation, and experimental and theoretical results are compared. A simplified lumped component equivalent circuit, to be used in circuit simulators such as SPICE, is presented, and its validity is investigated. The structure design requirements and procedure are presented. The model is used to optimize the design of the structure.
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- October 1987
- DOI:
- 10.1109/T-ED.1987.23208
- Bibcode:
- 1987ITED...34.2136E
- Keywords:
-
- Field Effect Transistors;
- Metal Oxide Semiconductors;
- Optimization;
- Bipolar Transistors;
- Current Density;
- Equivalent Circuits;
- Logic Circuits;
- Random Access Memory;
- Electronics and Electrical Engineering