Time Projection Compton Spectrometer (TPCS)

We present a new technique for measuring the energy spectrum of X-rays emitted by high-intensity, medium-voltage flash X-ray sources. The method sorts Compton electrons by drift velocity time-of-flight in a non-uniform magnetic field. We explain the conceptual design of the spectrometer, show how we have modeled it using Monte Carlo methods, and discuss the procedure for unfolding X-ray spectrum information from electron time-of-flight data. The technique appears promising, especially for short-pulse X-ray sources.