Interface polaritons in layered structures with metallized surfaces

The magnetoplasma interface polaritons propagating along an interface between a medium (in region II) described by an isotropic frequency-independent dielectric constant ɛ₂ and a semiconductor (in region III) characterized by an anisotropic, frequency-dependent dielectric function ɛ_ij(ω) are studied. The outer surfaces of the two media (regions II and III) are metallized (in regions I and IV) which serve to ground the tangential components of the electric fields. The electromagnetic field components and the dispersion relation for magnetoplasma interface polaritons are calculated using electromagnetic theory. The field components are then used to derive the expressions for Poynting vectors, energy densities, and energy velocity. The analytical expressions for the dispersion relation and the derived properties are found to be frequency dependent and size dependent. The computed results for metal-vacuum-InSb-metal system with magnetostatic field (B₀) perpendicular to the interfaces are illustrated and discussed in detail.