Transient optical grating in HgCdTe
Abstract
The transient grating technique has been used to study ambipolar diffusion and free carrier recombination in HgCdTe. The grating is created by the interference of two coherent 1.06 μm, 1 nsec pulses from a Nd:YAG laser. Decay of the grating is monitored by observing the first-order diffraction of a 1 μs, 10.6 μm laser pulse which is synchronized with the pump pulses. Ambipolar diffusion dominates the decay at small grating spacings and low excitation levels, while recombination is more important when the grating spacing is larger.
- Publication:
-
Advances in Laser Science-I
- Pub Date:
- August 1986
- DOI:
- 10.1063/1.35759
- Bibcode:
- 1986AIPC..146..245L
- Keywords:
-
- 42.85.Fe;
- 85.60.Gz;
- 72.20.Jv;
- Photodetectors;
- Charge carriers: generation recombination lifetime and trapping