Low level radiation testing of microelectronic components. Part 2: Preliminary studies of gamma dose rate effects on CMOS inverters, using the LORAD facility
Abstract
The Low Radiation Test Facility (LORAD) is described and results of threshold voltage shifts versus total ionizing dose on CMOS 4007 inverter devices are presented. The results indicate a dose rate effect and a dependence on the energy of the ionizing gamma photons. The tests demonstrate the validity of LORAD as a facility to simulate the space radiation environment.
- Publication:
-
Final Report United Kingdom Atomic Energy Authority
- Pub Date:
- February 1985
- Bibcode:
- 1985ukae.rept.....H
- Keywords:
-
- Cmos;
- Electronic Equipment Tests;
- Environmental Tests;
- Gamma Rays;
- Inverters;
- Radiation Effects;
- Space Environment Simulation;
- Ionization Coefficients;
- Photons;
- Radiation Dosage;
- Test Facilities;
- Electronics and Electrical Engineering