MMIC devices for active phased array antennas

Considerable progress has been made in the calculation and measurement of the scattering parameters of printed circuit discontinuities. These discontinuities occur in a variety of structures, such as transitions between rectangular waveguide and printed circuits, junctions between circuits of different dielectric constants, and filters and impedance matching circuits. Because of the variety of devices in which these discontinuities occur, it is very useful to understand them in as great a detail as possible. Both theoretical and experimental studies of discontinuities were considered. The theoretical studies have focused on finding ways to predict the scattering from discontinuities. The experimental studies have concentrated on developing measurement techniques for determining the scattering parameters of these discontinuities.