Bipolar VLSI technology

The fundamental aspects of speed, power dissipation, linear capability, nuclear radiation tolerance and manufacturability are discussed for bipolar VLSI technology. Ultimate speed limits for VLSI technology are considered. It is suggested that bipolar technology may ultimately prove to offer the lowest power dissipation for a given speed. Of increasing interest to users of VLSI chips is linear capability and the fundamental factors influencing linear performance. The performance of bipolar technology in the nuclear environment is discussed. MOST and bipolar technologies are compared. Finally, the practical ultimate limits of complexity for VLSI chips are discussed and the problems associated with achieving acceptable manufacturing yields are explored.