Microwave metrology of volumetric antenna structure and performance

An inversion process which reveals the artifacts in the radiating volume of the antenna structure and evaluates performance is described. The inversion process is based on the relationship between a radiated hemisphere in the far-field and the Ewald sphere in the Fourier domain. The procedures for estimating the current radiator distributions from Green's function are examined. The algorithm for predicting the far field of an unperturbed reflector is discussed. An example displaying the construction of a paraboloidal reflector from Fourier inversion of the three-dimensional Ewald sphere is presented.