Circuit analysis method for thinfilm solar cell modules
Abstract
The design of a thinfilm solar cell module is dependent on the probability of occurrence of pinhole shunt defects. Using known or assumed defect density data, dichotomous population statistics can be used to calculate the number of defects expected in a module. Probability theory is then used to assign the defective cells to individual strings in a selected seriesparallel circuit design. Iterative numerical calculation is used to calcuate IV curves using cell test values or assumed defective cell values as inputs. Good and shunted cell IV curves are added to determine the module output power and IV curve. Different levels of shunt resistance can be selected to model different defect levels.
 Publication:

Solar Cells
 Pub Date:
 December 1985
 Bibcode:
 1985SoCe...15..343B
 Keywords:

 Network Analysis;
 Solar Cells;
 Thin Films;
 Defects;
 VoltAmpere Characteristics;
 Electronics and Electrical Engineering