EE technical review
Abstract
Areas of research reported include: ultrafast gating of microchannel plate X-ray spectrometers, study of power MOS fast switching techniques, and lightning vulnerability of nuclear explosive test systems at the Nevada Test Site. Also included is a study of a computer model of the MFTF-B neutral beam accel dc power supply.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- June 1985
- Bibcode:
- 1985STIN...8612540.
- Keywords:
-
- Computerized Simulation;
- Electric Power Supplies;
- Lightning Suppression;
- Switching Circuits;
- X Ray Spectroscopy;
- Electrical Engineering;
- Electronic Equipment;
- Metal Oxide Semiconductors;
- Microanalysis;
- Microelectronics;
- Neutral Beams;
- Nuclear Devices;
- Electronics and Electrical Engineering