Tutorial: VLSI testing and validation techniques
Abstract
Computer-aided design and testing techniques for VLSI devices are examined in 46 previously published reviews and reports from the period 1973-1985. Topics examined include VLSI design validation; failures, fault models, and testing; testing regular structures and specific circuits; testable design and built-in self-test; and the future of VLSI test systems. Graphs, diagrams, photographs, drawings, and a glossary are provided.
- Publication:
-
NASA STI/Recon Technical Report A
- Pub Date:
- 1985
- Bibcode:
- 1985STIA...8713300R
- Keywords:
-
- Circuit Reliability;
- Computer Aided Design;
- Electronic Equipment Tests;
- Network Analysis;
- Very Large Scale Integration;
- Failure Analysis;
- Microelectronics;
- Network Synthesis;
- Self Tests;
- Electronics and Electrical Engineering