Using a molybdenum-silicon multilayer XUV mirror of 200 cm radius of curvature and 2 cm diameter which was developed by Barbee (1985), a 120 percent enhancement of the 182 A line intensity in the axial direction was demonstrated. The measured reflectivity at 182 A was 12 percent, the spark reproducibility was better than four percent, and the total measured bandpass was 20 A. No enhancement effect was noted at 186.7 A.
Applications of thin-film multilayered structures to figured X-ray optics
- Pub Date:
- August 1985
- Extreme Ultraviolet Radiation;
- Spectral Reflectance;
- Stimulated Emission;
- X Ray Lasers;