The design and fabrication of aluminum/niobium multilayers to be used as normal-incidence reflectors for 300 A radiation are presented. Preliminary characterization results are discussed showing the effects of interfacial roughness and diffusion.
Applications of thin-film multilayered structures to figured X-ray optics
- Pub Date:
- August 1985
- Extreme Ultraviolet Radiation;
- Metal Films;
- X Ray Diffraction;