Algorithm in Walsh function basis for analysis of integrated microcircuits on MOSstructures
Abstract
Use of a Walsh function basis facilitates computeraided design and performance analysis of integrated microcircuits, especially of those built on MOS structures for discrete processing of analog signals. As the integration scale increases here, so does the variance of correspondingly smaller geometrical dimensions and so does the deviation of electrophysical parameters. An analysis with direct application of the Walsh function basis then becomes difficult and unwieldy so that a faster convergence is needed for coverage of a wide range of simultaneously varying circuit parameters and external conditions, while taking into account all possible nonlinearities in the output characteristics. An algorithm is proposed to meet this need for any number of variable parameters, an algorithm which optimizes the convergence by minimizing the norm of differences between output (solution) vectors obtained in successive iterations. This is achieved by conversion of the deviations matrix into the Gray code, that can be regarded as a diadic vector. The procedure is demonstrated for the case where deviations of circuit components, signal sources, and power supplies are describable by Rademacher functions.
 Publication:

USSR Rept Electron Elec Eng JPRS UEE
 Pub Date:
 January 1985
 Bibcode:
 1985RpEEE....R..25P
 Keywords:

 Algorithms;
 Computer Aided Design;
 Integrated Circuits;
 Metal Oxide Semiconductors;
 Performance Tests;
 Walsh Function;
 Convergence;
 Signal Processing;
 Variability;
 Electronics and Electrical Engineering