Design of memory tests on the basis of analysis of sequences of functional operators

A method involving analysis of sequences of functional operators is used to derive a test which detect any combination of the subclass of defects in random access memory resulting from the mutual influence of arbitrary pairs of memory locations. The method is used to produce a minimal march requiring 30N operations. The method itself and the properties and types of sequences of functional operators can be used for more complex memory defect models as well. The properties of the sequences of functional operators established allow estimation of the completeness of the testing achieved by existing tests.