Secondary fluorescence correction in thick target pixe analysis
Abstract
A method for thick target PIXE analysis, which takes into account secondary fluorescence effects is presented. This simple, though approximate method yields results which are within 1% of a much more elaborate rigorous calculation. Examples are calculated for a proton energy of 1.4 MeV. The energy dependence of secondary X-ray yields is shown for some samples. The standard deviation of the results due to uncertainties in input data is ±4% for K-K excitation between 20 ⩽ Z ⩽ 30, but is otherwise worse. The proposed method was inserted into the algorithm used for the analysis of measured X-ray yields and tested on some alloys, where strong secondary effects were expected.
- Publication:
-
Nuclear Instruments and Methods in Physics Research A
- Pub Date:
- January 1985
- DOI:
- 10.1016/0168-9002(85)90296-7
- Bibcode:
- 1985NIMPA.228..482S