Secondary fluorescence correction in thick target pixe analysis
Abstract
A method for thick target PIXE analysis, which takes into account secondary fluorescence effects is presented. This simple, though approximate method yields results which are within 1% of a much more elaborate rigorous calculation. Examples are calculated for a proton energy of 1.4 MeV. The energy dependence of secondary Xray yields is shown for some samples. The standard deviation of the results due to uncertainties in input data is ±4% for KK excitation between 20 ⩽ Z ⩽ 30, but is otherwise worse. The proposed method was inserted into the algorithm used for the analysis of measured Xray yields and tested on some alloys, where strong secondary effects were expected.
 Publication:

Nuclear Instruments and Methods in Physics Research A
 Pub Date:
 January 1985
 DOI:
 10.1016/01689002(85)902967
 Bibcode:
 1985NIMPA.228..482S