HEMT technology gains on mm-waves
Abstract
In a high-electron-mobility transistor (HEMT), a silicon-doped AlGaAs layer grown on top of an undoped GaAs layer brings about the formation, on the GaAs side, of a 150-A thick two-dimensional electron gas layer which moves between doped and undoped material layers and forms the carrier channel to link the device source with the drain. A HEMT device, based on a 0.25-micron gate length geometry and operating at 38 GHz was shown to produce a minimum noise figure of 2.2 dB. When the transistor was cooled to 200 K, the noise figure dropped to 1.3 dB. With power-added efficiency of 26 percent at 30 GHz the HEMT appears to be well suited to space-based systems, where power supplies are at a premium. Tables and graphs illustrating the performance of various HEMT devices are included.
- Publication:
-
Microwaves
- Pub Date:
- November 1985
- Bibcode:
- 1985MicWa..24..121B
- Keywords:
-
- Electron Mobility;
- High Electron Mobility Transistors;
- Microwave Amplifiers;
- Millimeter Waves;
- Power Gain;
- Random Noise;
- Aluminum Gallium Arsenides;
- Field Effect Transistors;
- Gallium Arsenides;
- Josephson Junctions;
- Electronics and Electrical Engineering