An extrinsic Si thermal-imaging array
Abstract
A novel co-ordinate addressed structure for a slow photoconductor is described which requires only a simple contact pattern to make a large array. The principle has been applied to radiation-damaged doped p-Si, which has a spectral response matching the 3-4.2 μm atmospheric transmission band. "Staring" thermal imagery with temperature resolution better than 0.1 K has been demonstrated with real-time uniformity correction and display. It is predicted that this level of performance could be achieved in arrays comprising $∼10 5 picture points
- Publication:
-
Infrared Physics
- Pub Date:
- July 1985
- DOI:
- 10.1016/0020-0891(85)90021-1
- Bibcode:
- 1985InfPh..25..647H
- Keywords:
-
- Arrays;
- Infrared Detectors;
- Infrared Imagery;
- Silicon;
- Thermal Mapping;
- Carrier Density (Solid State);
- Fabrication;
- P-Type Semiconductors;
- Performance Tests;
- Spectral Sensitivity;
- Very Large Array (Vla);
- Electronics and Electrical Engineering