Parameter extraction from spaceborne MOSFETs
Abstract
An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1985
- DOI:
- Bibcode:
- 1985ITNS...32.4237B
- Keywords:
-
- Astrionics;
- Chips (Memory Devices);
- Cmos;
- Field Effect Transistors;
- Metal Oxide Semiconductors;
- Radiation Damage;
- Circuit Diagrams;
- Cobalt 60;
- Parameter Identification;
- Random Access Memory;
- Electronics and Electrical Engineering