RF surface resistance in Nb3Sn thin films
Abstract
The deposition parameters of electron-beam evaporated Nb3Sn films are optimized in order to yield the best RF properties. The surface resistance of the samples is measured between 1.5 and 18 K using a calorimetric technique. Broad transitions and excessive losses are found, indicating the presence of inhomogeneities in the materials. A new deposition procedure, phase-locking, which results in more homogeneous materials is described. The data are compared with predictions of the BCS theory of both Nb3Sn and Nb. Agreement between experiment and theory is quite good down to about 10 K where the residual losses become significant.
- Publication:
-
IEEE Transactions on Magnetics
- Pub Date:
- March 1985
- DOI:
- 10.1109/TMAG.1985.1063863
- Bibcode:
- 1985ITM....21..525A
- Keywords:
-
- Electrical Resistance;
- Electron Beams;
- Niobium Stannides;
- Superconductors;
- Surface Properties;
- Thin Films;
- Microwave Circuits;
- Phase Diagrams;
- Temperature Dependence;
- Vapor Deposition;
- Solid-State Physics