An improved method for detecting functional faults in semiconductor random access memories

This paper presents an efficient test procedure for the detection of simultaneously present functional faults in semiconductor random access memories (RAM's). The proposed procedure detects modeled types of functional faults using 36N + 24N log2 N operations, which is an improvement over existing techniques. The testing process is twofold: first, it detects simple functional faults by a linear address marching. Second, it detects more complex types of functional faults by a nonlinear address sequencing approach. Simulation results to support the testing procedure are also presented.