Observation of electron velocity overshoot in sub-100-nm-channel MOSFET's in Silicon Chou, S. Y. ; Antoniadis, D. A. ; Smith, H. I. Abstract Publication: IEEE Electron Device Letters Pub Date: December 1985 DOI: 10.1109/EDL.1985.26267 Bibcode: 1985IEDL....6..665C