Linearity of pMOS radiation dosimeters operated at zero bias
Abstract
A new mode of operation of pMOS radiation dosimeters is explored, using zero applied oxide field. Over a certain dose range, a linear dependence of response against dose was found. Charge pumping currents and threshold voltages were measured as a function of dose.
- Publication:
-
Electronics Letters
- Pub Date:
- June 1985
- DOI:
- Bibcode:
- 1985ElL....21..570H
- Keywords:
-
- Dosimeters;
- Metal Oxide Semiconductors;
- P-Type Semiconductors;
- Radiation Dosage;
- Radiation Effects;
- Electric Potential;
- Linearity;
- Thickness;
- Electronics and Electrical Engineering