Two-dimensional E-field mapping with subpicosecond temporal resolution
Abstract
A new contactless reflection-mode electro-optic sampling technique is described which is capable of characterizing the electrical response of microstructures in two dimensions with micrometer spatial resolution, a temporal response of a fraction of a picosecond and millivolt sensitivity. A GaAs-based sampling technique which would have minimum interference with the test circuit is also proposed.
- Publication:
-
Electronics Letters
- Pub Date:
- June 1985
- DOI:
- 10.1049/el:19850401
- Bibcode:
- 1985ElL....21..568M
- Keywords:
-
- Data Sampling;
- Electric Pulses;
- Electrical Measurement;
- Electro-Optics;
- Gallium Arsenides;
- Pulsed Lasers;
- Temporal Resolution;
- Electronics and Electrical Engineering