Dynamic sensitivity analysis for the waveform relaxation method
Abstract
Procedures for a sensitivity analysis using the waveform relaxation method (WRM) are derived and their efficiency discussed. The WRM is briefly reviewed, the system of equations for the sensitivity analysis is derived, and two sensitivity analysis procedures are considered: a time-point analysis and an iterative method. The advantages and drawbacks of these procedures with regard to computing time, storage space requirements, and implementation potential are discussed.
- Publication:
-
Archiv Elektronik und Uebertragungstechnik
- Pub Date:
- February 1985
- Bibcode:
- 1985ArElU..39...20N
- Keywords:
-
- Dynamic Characteristics;
- Integrated Circuits;
- Relaxation Method (Mathematics);
- Waveforms;
- Differential Equations;
- Large Scale Integration;
- Metal Oxide Semiconductors;
- Optimization;
- Sensitivity;
- Electronics and Electrical Engineering