Photothermal analysis of thin films
Abstract
Applications of photothermal depth profiling are described. Most recent results demonstrate the use of thermal delay lines and multiplex techniques.
- Publication:
-
Unknown
- Pub Date:
- August 1984
- Bibcode:
- 1984patf.rept.....C
- Keywords:
-
- Delay Lines;
- Depth;
- Multiplexing;
- Thin Films;
- Excitation;
- Optical Properties;
- Spectra;
- Thermodynamic Properties;
- Solid-State Physics