VUV synchrotron light as a technique for studying the interface quality and properties of thin overlayers
Abstract
The value of synchrotron light for determining both the electronic strucutre of overlayers, and the physical nature of the overlayer-substrate interface is shown. Deposited layers and thermally stabilized layers are compared and the bonding energy between the overlayer and substrate is estimated.
- Publication:
-
Presented at the Mater. Res. Soc. Ann. Meeting
- Pub Date:
- December 1984
- Bibcode:
- 1984mrs..meet...26R
- Keywords:
-
- Atomic Structure;
- Interfaces;
- Synchrotron Radiation;
- Thin Films;
- Adhesion;
- Energy Levels;
- Nickel;
- Palladium;
- Synchrotrons;
- Tantalum;
- Valence;
- Electronics and Electrical Engineering