Electrical characterization of VLSI (Very Large Scale Integration) memories
Abstract
Automatic and bench techniques are used to characterize the performance of several VLSI memory types. The characterization addressed AC, DC, program and erasure parameters over the full military voltage and temperature ranges. Data summaries are presented.
- Publication:
-
Final Technical Report
- Pub Date:
- May 1984
- Bibcode:
- 1984gec..reptQ....S
- Keywords:
-
- Memory (Computers);
- Very Large Scale Integration;
- Alternating Current;
- Computer Programming;
- Direct Current;
- Electric Potential;
- Integrated Circuits;
- Military Technology;
- Read-Only Memory Devices;
- Ultraviolet Radiation;
- Electronics and Electrical Engineering