Design of self-checking N-MOS (H-MOS) integrated circuits

The design of self-checking N metal oxide semiconductor circuits is discussed. Two types of test are planned for the use of these circuits: on-line testing to detect failures during the function run of software; and off-line testing, with an emphasis on detection and localization for maintainability. The design of these circuits is based on transistor level fault hypotheses. The design of a functional part, the design of a checker, and procedures/design rules for a design for maintainability are addressed.