Development of standardized specifications for screening space level integrated circuits and semiconductors
Abstract
Standardized methods are established for screening of JAN B microcircuits and JANTXV semiconductor components for space mission or other critical applications when JAN S devices are not available. General specifications are provided which outline the DPA (destructive physical analysis), environmental, electrical, and data requirements for screening of various component technologies. This standard was developed for Air Force Space Division, and is available for use by other DOD agencies, NASA, and space systems contractors for establishing common screening methods for electronic components.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- July 1984
- Bibcode:
- 1984STIN...8429093.
- Keywords:
-
- Checkout;
- Integrated Circuits;
- Semiconductor Devices;
- Spacecraft Electronic Equipment;
- Specifications;
- Standards;
- Destructive Tests;
- Electrical Properties;
- Microelectronics;
- Temperature Effects;
- Thermal Cycling Tests;
- Electronics and Electrical Engineering