Analysis of LED degradation - Proton-bombarded GaAs
Abstract
An analysis is given of the degradation of light-emitting, Zn-diffused GaAs diodes after proton bombardment. Use is made of a generally applicable method by which the external bulk quantum efficiency and the injection efficiency of an LED can be determined separately. Owing to the increase of non-radiative recombination being larger in the bulk than in the space-charge region, the injection efficiency at constant current first starts to increase and then decreases as a function of irradiation fluence. Furthermore, it is shown that the apparent bulk quantum efficiency decreases superlinearly with the irradiation fluence. This is consistent with the theory for a linear-graded pn junction and the assumption that the concentration of additional killer centres is directly proportional to the irradiation fluence.
- Publication:
-
Solid State Electronics
- Pub Date:
- March 1984
- DOI:
- Bibcode:
- 1984SSEle..27..253T
- Keywords:
-
- Carrier Injection;
- Gallium Arsenides;
- Light Emitting Diodes;
- Proton Damage;
- Proton Irradiation;
- Quantum Efficiency;
- Degradation;
- Life (Durability);
- Majority Carriers;
- Minority Carriers;
- Space Charge;
- Zinc;
- Electronics and Electrical Engineering