Ensuring required metrological reliability of analog instrument channels by parametric compensation

The method of parametric compensation is proposed for ensuring the required reliability of analog instrument channels in aggregate measurement and information systems, considering that aggregation with analog channels is limited by the finite number of available standard functional components. The iterative algorithm of parametric compensation and synthesis through solution of that inequality with lower bound was programmed in FORTRAN-IV for a vector of continuous assembly parameters and with proximity of the aging model to the mathematical expectation of changes model as optimality criterion. First the vector of assembly parameters is varied and then, if necessary, the mathematical expectation of changes. The method was successfully applied to an automatic control and regulation system with an analog instrument channel containing 16 functional components, using a comparator consisting of one integrated circuit, 3 transistors, 7 diodes, 5 capacitors, and 20 resistors as compensator.